Comment by harshreality
3 months ago
If you stress test small address ranges around each failing address, does that selectively heat up the chip to which that address routes?
Then all you'd need is an infrared imager.
3 months ago
If you stress test small address ranges around each failing address, does that selectively heat up the chip to which that address routes?
Then all you'd need is an infrared imager.
Alternatively, could you stress test the failing addresses while selectively heating each chip in turn with a hot air gun and checking if the error rate changes?