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Comment by ChrisMarshallNY

4 days ago

I do both. I like to develop designs in my head, and there’s a lot of trial and error.

I think the results are excellent, but I can hit a lot of dead ends, on the way. I just spent several days, trying out all sorts of approaches to PassKeys/WebAuthn. I finally settled on an approach that I think will work great.

I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary.

> I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary.

To be fair it’s great advice when you’re dealing with atoms.

Mutable patterns of electrons, not so much (: